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Purchase your copy of ASTM E – 02() as a PDF download or hard copy directly from the official BSI Shop. All BSI British Standards. Find the most up-to-date version of ASTM E at Engineering ASTM E – E – 02 The test methods provide for reporting of specic, distinctive informati.

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The operator can set any size field area using the Set Field button. Examples of random duplex grain sizes include: Accordingly, the layer depth of 1. A sample application of this procedure appears in Appendix X1, along with formulas for calculating mean intercept lengths, and area fractions.

The use of these is described in detail in Methods E Assigning an average grain size value to a duplex grain size specimen does not adequately characterize the appearance of that specimen, and may even misrepresent its appearance.

ASTM E1181 – 02(2015)

If microscopic examination is subsequently necessary, individual specimens must be taken to allow estimation of area fractions for the entire product cross-section, and to allow determination of grain sizes representing the entire cross-section as well. Signicance and Use 5.

Such a method is subject to considerable error. These different applications are described in 8. The Planimetric Procedure of E does not lend itself to determination of grain size in distinct small areas, and so should not be used. Choose any of several preparation functions with a single mouse click.


Standard test methods for characterizing duplex grain sizes – CERN Document Server

In this example, the results would be reported as: That division is indicated in Table X2. For example, averaging two distinctly different grain sizes may result in reporting a size that does not actually exist anywhere in the specimen. Begin by outlining the distinct grain size regions in a given image, either on a transparent overlay placed over the projected image, or directly on a photomicrograph. Four procedures for estimating area fraction are described, the simplest to apply resulting in the least precision, and the most complicated resulting in the greatest precision.

Duplex grain structures for example, multiphase alloys are not necessarily duplex in grain size, and as such are not the subject of these methods.

The entire macroetched cross-section should be used as a basis for estimating area fractions occupied by distinct grain sizes, if possible.

Click here to display results spreadsheet. Note that it is not necessary to resolve the individual ne grains in the image.

ASTM E – 02 Standard Test Methods for Characterizing Duplex Grain Sizes

An example photomicrograph of the banding condition appears in Fig. This standard does not purport to address all of the safety concerns associated with its use.

An arbitrary division was made between the two distinct distributions of grain sizes. Users of this standard are expressly advised that determination of the validity of any such patent rights, and the risk of infringement of such rights, are entirely their own responsibility.


These items are briey described below, under the headings of the specic procedures to which they apply. For the coarse grain size, the number of intercepts totaled 13, and the intercept length totaled Precision and Bias 9. The area fraction occupied by the coarse grain was calculated from the corresponding values, as These data may be used to assess the nature of the observed grain size distribution, and to determine mean intercept lengths and area fractions for distinct segments of a total distribution.

The values in the seventh column were summed to give the total intercept length for this evaluation A further example appears in Fig. For example, averaging two distinctly different grain sizes may result in reporting a size that does not actually exist anywhere in the specimen.

For instance, banding present in a given specimen may not be easily recognizable in a transverse orientation. Measures grain boundary intercept distances or individual grain areas. However, these steels may also exhibit a bimodal grain size condition solely within the ferrite grain structure. The Comparison Procedure is the simplest, but offers the least accuracy.